关于特征X射线在γ谱仪低能效率刻度应用中偏差问题的初步探讨  

Discussion about difficulties in calibrating low energy detection efficiency of the γ ray spectrometer with using characteristic X rays

作　　者：郑锐[1] 苏琼[1] 程建平[1] 

机构地区：[1]清华大学工程物理系,北京100084

出　　处：《核电子学与探测技术》2003年第4期324-328,共5页Nuclear Electronics & Detection Technology

摘　　要：分析了在用天然放射性232Th衰变系的低能X射线进行HPGeγ谱仪的效率刻度时出现系统偏差的原因,并就此对实际应用中应注意的问题进行了探讨。提出了特征X射线的符合相加等效应在低活度γ谱分析中可能会引起的一系列问题以及应采取的措施。This paper analyzes the reasons for the errors of scaling detection efficiency of the HPGeγ spectrometer using the low energy characteristic X rays from 232Thdecay series, discusses the problems which should be paid attention to in measuring and indicates that the coincidencesumming effect of characteristic X rays would cause a series of problems in measuring low radioactivity activities and how to resolve the problems. 

关 键 词：特征X射线 Γ谱仪 低能效率刻度 应用 偏差 衰变 放射性活度 

分 类 号：TL817.2[核科学技术—核技术及应用]