基于路径的数字系统功能测试  

A New Method for Digital System Functional Testing Based on Paths

作　　者：龚茂康[1] 蒋璇[1] 

机构地区：[1]南京航空学院电子工程系

出　　处：《南京航空学院学报》1992年第6期796-802,共7页

摘　　要：本文介绍基于路径的数字系统功能测试方法。路径表示系统在输入信号作用下状态的转换。文章提出并实现了遍历路径的测试矢量生成算法;讨论了利用数字系统硬件描述语言及其模拟器生成被测系统在测试矢量序列激励下的无故障响应序列的方法;并介绍运用无故障响应序列与实际响应序列进行比较测试的故障定位法。应用上述方法,笔者在研制的NAT-403Ⅰ型数字设备自动测试仪上对三种板级数字系统进行了测试,获得预期的效果。This paper discusses a new method for digital system functional testing based on paths. The concept of path is used to represent the state transformation of digital system under certain inputs. An algorithm for generating a testing vector sequence based on paths is presented and realized. A method is also given for generating a set of error-free response vector sequence under the stimulation of testing vector sequence by hardware description language and its simulator. Fault location can be realized by comparing the error-free response with the response of the system under test.The concepts and methods discussed in this paper are successfully applied to the testing of several kinds of board level digital systems with 'NAT-4031 ATE' which is designed and assembled by the authors. The testing result is as expected.

关 键 词：通路 故障定位 功能测试 硬件 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]