X-ray absorption fine structure spectroscopy in nanomaterials  

同步辐射XAFS技术在纳米科学研究中的应用（英文）

作　　者：孙治湖 刘庆华 姚涛 闫文盛 韦世强 

机构地区：[1]National Synchrotron Radiation Laboratory, University of Science and Technology of China

出　　处：《Science China Materials》2015年第4期313-341,共29页中国科学（材料科学（英文版）

基　　金：supported by the National Natural Science Foundation of China (11135008, 11175184 and 11475176);the Foundation for Innovative Research Groups of the National Natural Science Foundation of China (11321503)

摘　　要：X-ray absorption fine structure(XAFS) spectroscopy has been widely used for decades in a wide range of scientific fields, including physics, chemistry, biology, materials sciences, environmental sciences, etc. This review article is devoted to the applications of XAFS in nanomaterials. The basic principles of XAFS are briefly described from the view point of practical application, including its theory, data analysis and experiments. Using selected examples from recent literatures, the power of XAFS in determination of local atomic/electronic structures is illustrated for various nanomaterials, covering metal and semiconductor nanoparticles, catalysts, core/shell structures, ultrathin nanosheets, and so on. The utilization of time-resolved XAFS technique is also briefly introduced, for in-situ probing the nucleation/growth processes of nanomaterials and identifying reaction intermediates of nanostructured catalysts under operando conditions.X射线吸收精细结构谱学(XAFS)技术是近40年来同步辐射领域最为重要的实验技术之一,在物理、化学、生物、材料和能源科学等诸多领域得到了广泛应用.本文简要综述了XAFS技术在纳米材料科学研究中的应用.首先介绍了XAFS的基本原理、实验方法及数据分析处理过程,进一步通过对XAFS技术在应用于纳米材料研究中的一些代表性工作进行概述,如金属与半导体纳米颗粒、催化剂、核壳结构、二维超薄纳米片,以及原位XAFS技术在研究纳米材料的原位成核/生长过程和纳米催化剂在工作状态下的中间态表征等,展示了XAFS技术在纳米材料领域对其原子和电子结构表征的强大能力.

关 键 词：XAFS Zn XANES RGO Pt 同步辐射 磁轫致辐射 轫致辐射 

分 类 号：TB383.1[一般工业技术—材料科学与工程]