基于布尔偏导数的组合电路双故障检测的新方法  

New method testing the double fault of combinational circuits based on Boolean partial derivative.

作　　者：余党军[1] 陈偕雄[2] 

机构地区：[1]金华职业技术学院,浙江金华321017 [2]浙江大学信息与电子工程学系,浙江杭州310028

出　　处：《浙江大学学报（理学版）》2003年第5期536-538,共3页Journal of Zhejiang University（Science Edition）

摘　　要：分析了布尔偏导数与布尔差分的关系,给出了基于布尔偏导数的组合电路双故障测试集的方程,引入了奇集合的概念.在此基础上提出了基于布尔偏导数的组合电路双故障检测的新方法.实例表明该方法具有思路清晰、操作简单及易于掌握的优点.This paper analyzes the relations of Boolean partial derivative and Boolean difference, gives the equation of the test set for the double fault of a combinational circuit, and introduces the concept of the odd set. Then, a new method testing the double fault of combinational circuits based upon Boolean partial derivative is proposed. Examples show that it has several advantages such as clear thought, simple operation and easy understanding.

关 键 词：组合电路 双故障检测 布尔偏导数 布尔差分 奇集合 检测方法 数字电路 

分 类 号：TN791.07[电子电信—电路与系统]