利用CCD测量单缝衍射光强分布  

Measurement of the Intensity Distribution of the Diffraction by Narrow Slit with CCD

作　　者：孟继轲[1] 杨型健[1] 时振涛[1] 

机构地区：[1]太原重型机械学院,太原030024

出　　处：《太原重型机械学院学报》2003年第3期205-208,共4页Journal of Taiyuan Heavy Machinery Institute

摘　　要：利用一种新型半导体集成光电器件,即CCD(ChargeCoupleDevices)电荷耦合器件,并通过CCD专用接口卡来直接测量单缝衍射光强分布,实现测试数据自动采集和实验结果自动输出。叙述了线阵CCD测量光强度的原理,分析了系统的软、硬件设计及测试结果。The intensity distribution of the diffraction by narrow slitis directly measured with CCD and specialized interface card .The data's automatic collection and the results' automatic output are realized. The principle of linear CCD which measures the intensity is briefly discussed. The software and hardware designs of the system and measuring results are analyzed.

关 键 词：单缝衍射 电荷耦合器件 模数转换 光强分布 CCD 测量 

分 类 号：TB96[机械工程—光学工程] TN386.5[一般工业技术—计量学]