BaTiO_3半导瓷失效机理及可靠性增长技术  

The Failure Mechanism of BaTiO_3 Semiconducting Ceramics and the Technologies for Enhancing the Reliability

作　　者：黎步银[1] 姜胜林[1] 龚树萍[1] 周东祥[1] 

机构地区：[1]华中科技大学电子科学与技术系,湖北武汉430074

出　　处：《电子元件与材料》2003年第10期29-32,共4页Electronic Components And Materials

基　　金：湖北省自然科学基金资助项目(2001ABB019);国家863计划项目2001AA325040)

摘　　要：为了提高BaTiO3半导瓷的可靠性,系统地研究了可靠性增长技术。针对BaTiO3半导瓷不同的失效模式,重点研究了瓷体电场分布、电阻率及温场分布、热应力、电极界面应力对BaTiO3半导瓷可靠性的影响及其作用机理,并从原材料控制、材料配方设计、均匀化技术、电极技术及测试技术等方面提出了增加可靠性的方法。The technologies for enhancing the reliability of BaTiO3 semiconducting ceramics were studied. The mechanism of different failure modes of BaTiO3 semiconducting ceramics were analyzed. The emphasis was put on the distribution of electrical field, the distribution of resistivity and temperature, the inner thermal stress and the stress on electrode interfaces. Some methods to increase the reliability of BaTiO3 semiconducting ceramics are proposed, including the control of raw materials, the material formulas, the homogenization process, the electrode technology and the measurement techniques.

关 键 词：钛酸钡半导瓷 可靠性 失效模式 失效机理 

分 类 号：TN304.82[电子电信—物理电子学]