原子力显微镜观察T-颗粒乳剂晶体形貌  

THE MORPHOLOGY OF THE T-GRAIN OBSERVED BY AFM

作　　者：曹立志[1] 王晗[1] 焦家俊[1] 庄思永[1] 

机构地区：[1]华东理工大学精细化工研究所,上海200237

出　　处：《感光科学与光化学》2003年第5期334-337,共4页Photographic Science and Photochemistry

基　　金：国家自然科学基金资助项目(20073013)

摘　　要：应用原子力显微镜对T 颗粒照相乳剂晶体表面形貌进行观察,直接测得样品的大小和厚度.得到的精细结构显示样品表面不是平坦的,而是呈现凸凹不平的结构,高低起伏最大可达5nm左右.样品经充分曝光后起伏增大到9nm左右,说明银原子簇优先在较活泼的凸起部位生成.The morphology of the Tgrain was observed by a AFM.The size and the thickness of a crystal,and the fine morphology of the surface of the Tgrain was obtained.The results showed that the surface contained a number of protrusions,which grew after a long time exposure indicating that the photolytic silver clusters,or the latent images,were formed preferentially at active positions on the surface of the grain.

关 键 词：原子力显微镜 照相乳剂 T-颗粒 形貌 

分 类 号：TQ571[化学工程—精细化工]