纳米CeO_2基电解质薄膜电性能实验研究  

Electrical Performance Experiment of Nano-CeO_2 Base Electrolytic Film

作　　者：张德新[1] 岳慧敏[2] 

机构地区：[1]郧阳师范高等专科学校物理系,湖北丹江口442700 [2]华中科技大学物理系,湖北武汉430074

出　　处：《江汉石油学院学报》2003年第3期154-155,共2页Journal of Jianghan Petroleum Institute

基　　金：湖北省教育厅重点科研项目(2003A003)

摘　　要：研究了不同热处理温度和不同测试温度下,纳米CeO_2基薄膜的电性能。结果表明,纳米CeO_2基薄膜在热处理温度为600℃和900℃时,其伏安特性曲线近似为线性特征;在热处理温度为700℃和800℃时,其伏安特性曲线中存在VCNR现象。结合纳米CeO_2基薄膜的XRD图,对纳米CeO_2基薄膜的电性能进行了理论分析和讨论。Electrical performance of a nano-CeO2 base electrolytic film is studied under different heat treating temperature and testing temperature. The result shows that the volt-ampere characteristic curve of the nano-CeO 2 base electrolytic film is approximate to linear property under heat treating temperature of 600° and 900°, there exists VCNR in the curve under 700° and 800° heat treating temperature. In combination with XRD diagram of the CeO2 base electrolytic film, theoretical analysis and a discussion are conducted on electrical performance of nano-CeO2 base film.

关 键 词：二氧化铈 溶胶-凝胶法 薄膜 纳米材料 电性 

分 类 号：O484.4[理学—固体物理]