电子产品退化失效的BS模型  

BS Model for Degradation Failure of Electronic Product

作　　者：钟征[1] 孙权[1] 周经伦[1] 

机构地区：[1]国防科技大学系统工程研究所,湖南长沙410073

出　　处：《电子产品可靠性与环境试验》2003年第5期4-8,共5页Electronic Product Reliability and Environmental Testing

基　　金：国家863惯性约束聚变领域资助课题(863-416专题);项目编号:2003AA845023

摘　　要：退化失效的电子产品的寿命试验通常只能得到性能退化的数据,使用传统的方法很难对其可靠性进行评估。考虑到电子产品的退化类似于材料的疲劳,以金属化膜电容器为例,研究了BS模型在电子产品可靠性中的应用。从金属化膜电容器的失效过程推导出了该类型电容器的BS模型,经过计算比较,BS模型对脉冲电容器可靠性的评估要优于Weibull等其它模型。该实侧证明BS模型能应用于电子产品的退化失效。The failure of some electronic products is defined in terms of a specified level of degradation. Life tests can only provide degradation measurements over time. In such cases, it is difficult to assess reliability with traditional reliability model. The degradtation of electronic product is similar to the fatigue of materials. Metallized fdm pulse capacitor is used as an example to research the application of BS model for reliability of electronic product in this paper. BS model for the capacitor is derived from the process of failure. Compared with other models, such as Weibull model, BS model is better for assessing reliability of metallized film pulse capacitor. From this example, we believe BS model could be used for degradation failure of electronic product.

关 键 词：电子产品 可靠性 退化失效 BS模型 金属化膜 脉冲电容器 

分 类 号：TN602[电子电信—电路与系统] TB114.3[理学—概率论与数理统计]