红外热成像无损检测缺陷的一种新方法  

A NEW METHOD TO EVALUATE THE SUBSURFACE DEFECT BY THERMAL NONDESTRUCTIVE TESTING

作　　者：梅林[1] 王裕文[1] 薛锦[1] 

机构地区：[1]西安交通大学机械工程学院,陕西西安710049

出　　处：《红外与毫米波学报》2000年第6期457-459,共3页Journal of Infrared and Millimeter Waves

摘　　要：通过脉冲加热阶段的红外无损检测一维理论模型 ,提出了一种评估缺陷深度信息的新算法 ,并给出了有限元模拟检测结果 ,分析了缺陷大小及脉冲加热时间对检测结果的影响、分析表明 。A new method was presented to evaluate the depth of subsurface defect by using the 1 D theoretical model of infrared NDT during pulsed heating and the simulation test results of finite elements were given. The influences of defect size and heating time were analyzed by simulating the process of thermal NDT. The results show that this new method has better precision than other methods.

关 键 词：红外热成像 无损检测 数学模型 有限元 

分 类 号：TN219[电子电信—物理电子学]