Bi2223/Ag带双饼线圈失超电压耦合补偿测试  

Uc SURVEY OF THE BI2223/AG DOUBLE-PANCAKE

作　　者：张京业[1] 陈敬林[1] 许爱霞[1] 张勇[1] 陈治友[1] 王福堂[1] 丁立人[1] 高秉钧[1] 

机构地区：[1]中国科学院等离子体物理研究所强磁场实验室,合肥230031

出　　处：《低温工程》2003年第5期44-48,共5页Cryogenics

摘　　要：为排除双饼线圈两端的自感电压对其失超信号的影响,把它降低到测量所允许的范围内,本文介绍双饼线圈外加补偿线圈的耦合测试原理和在此基础上制成的Ic测试装置。分别对研制的9个高温超导双饼线圈的Ic进行测试,获得非常好的实验结果,为将9个双饼线圈组合成磁体提供了依据。For reducing the effect of the self-induced voltage of the double-pancake coil to a minimum value on its disspation voltage measurement, the principles of the compensation circuit were introduced . A equipment for testing the Ic of the HTS coils was built. And the critical current of the nine pancakes were measured. The basis for combining the nine double-pancakes into a magnet was provided by the result.

关 键 词：BI2223/AG 高温超导双饼线圈 补偿线圈 失超信号 自感电压 

分 类 号：TM55[电气工程—电器] TM26[一般工业技术—材料科学与工程]