相移电子散斑干涉测量物面形状  

3D Shape Measuring Using Phase—Shifting Electronic Speckle Pattern Interferometry

作　　者：金峰[1] 伍小平[1] 张海波[1] 

机构地区：[1]中国科学技术大学

出　　处：《实验力学》1992年第2期171-176,共6页Journal of Experimental Mechanics

基　　金：国家自然科学基金

摘　　要：本文提出了一种用于测量三维物体表面形状的新方案.利用电子散斑干涉仪,通过两次图像采集之间折射率变化,获得代表等高线的相关条纹图,应用相移技术,可以获得高精度的形状测量结果.文中还讨论了自制气体相移器原理及性能。A new 3D shape measuring method is proposed.By means of Electronic Speckle Pattern Interferometer(ESPI),the coherent patterns corresponding to contour map are ob- tained by choosing different index of refraction at each of the two courses of image—collecting. The high accurate result can be obtained while applying phase—shifting technique.Aside from this,a new air phase—shifter developed is also discussed.

关 键 词：电子散斑干涉 相移 物面形状 ESPI 

分 类 号：O348[理学—固体力学]