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作 者:SONGYuan-he FANChang-zhou GUOYing LIHong-wei ZHAOHong
机构地区:[1]7thDept.,InstituteofTelecom.Eng.,AFEngineeringUniversity,Xi‘an710077,CHN [2]InstituteforLaser&Infrar.Appl.,Xi’anJiaotongUniversity,Xi‘an710049,CHN
出 处:《Semiconductor Photonics and Technology》2003年第4期260-262,共3页半导体光子学与技术(英文版)
摘 要:Using the method of line structure light produced by a laser diode,three dimensional profile measurement is deeply researched.A hardware circuit developed is used to get the center position of light section for the improvement of the measurement speed.A double CCD compensation technology is used to improve the measurement precision. An easy and effective calibration method of the least squares to fit the parameter of system structure is used to get the relative coordinate relationship of objects and images of light section in the directions of height and axis. Sensor scanning segment by segment and layer by layer makes the measurement range expand greatly.Using the method of line structure light produced by a laser diode, threedimensional profile measurement is deeply researched. A hardware circuit developed is used to getthe center position of light section for the improvement of the measurement speed. A double CCDcompensation technology is used to improve the measurement precision. An easy and effectivecalibration method of the least squares to fit the parameter of system structure is used to get therelative coordinate relationship of objects and images of light section in the directions of heightand axis. Sensor scanning segment by segment and layer by layer makes the measurement range expandgreatly.
关 键 词:3D profile measurement laser diode line scanning measurement machine
分 类 号:TP391.41[自动化与计算机技术—计算机应用技术]
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