用探孔场发射显微镜研究单壁碳纳米管的场发射  

Study of Field Emission from Single-Walled Carbon Nanotubes Using Probe-Hole Method

作　　者：张兆祥[1] 张耿民[1] 金新喜[1] 侯士敏[1] 赵兴钰[1] 顾镇南[2] 刘惟敏[1] 薛增泉[1] 

机构地区：[1]北京大学信息科学技术学院电子学系,北京100871 [2]北京大学化学工程与分子学院,北京100871

出　　处：《电子学报》2003年第11期1623-1625,共3页Acta Electronica Sinica

基　　金：国家自然科学基金 (No .60 2 31 0 1 0 ;No .90 2 0 60 4 8;No .60 1 71 0 2 5) ;国家重点基础研究资助项目 (No.2 0 0 1CB61 0 50 3) ;教育部博士点基金 (No.2 0 0 2 0 0 0 1 0 0 3) ;教育部留学回国科研启动基金 (No .60 1 2 81 0 1 )

摘　　要：探孔场发射显微镜可以观测样品的场发射图象 ,又能测量局域场发射电流和总场发射电流与电压的关系 .本文利用具有二维调节探孔位置的场发射显微镜装置测量了单壁碳纳米管场发射图象不同区域、不同吸附状态和经过热处理后的I V特性 .A probe-hole Field Emission Microscope (FEM) features the capability of measuring the respective dependence of local and total field emission currents on applied voltage. A FEM equipped with a probe-hole, which could be submitted to two-dimensional motion, was employed to acquire curves of field emission current versus applied voltage of single-walled carbon nanotubes (SWCNTs). The field emission currents were acquired from different regions and different adsorption states. Furthermore, the influence of heat treatment on current-voltage behaviors of the SWCNTs was also studied.

关 键 词：场发射 场发射显微镜 单壁碳纳米管 

分 类 号：TN304[电子电信—物理电子学]