Φ3英寸双面超导薄膜J_c 均匀性测量  

STUDY OF THE J_c HOMOGENEITY OF THE Φ3 INCH DOUBLE-SIDES SUPERCONDUCTING THIN FILMS

作　　者：王小平[1] 王霈文[1] 李季[1] 李弢[1] 齐善学[1] 华志强[1] 古宏伟[1] 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《低温物理学报》2003年第A01期234-237,共4页Low Temperature Physical Letters

摘　　要：临界电流密度Jc 是评价超导薄膜质量的重要参数之一 .采用Jc 测量装置可以准确、快速、无损检测Φ2～ 3英寸双面膜的Jc 均匀性 .该装置是利用高温超导薄膜的超导转变对线圈内感应电压产生的变化这一原理 ,测量线圈由初级和次级组成 .所用信号频率为 2 0kHz.次级信号在同样频率下由锁相放大器检测 .测量过程全部由计算机控制 .对于超导微波滤波器应用所要求的高质量Φ2～ 3英寸双面超导薄膜材料 ,必须具有高的Jc 和低的Rs 值 .采用该装置测量超导薄膜的Jc 均匀性 ,与Rs 对应关系进行分析 ,将有助于超导薄膜的质量控制 .The critical current density J-c is one of the most important factors to evaluate the quality of superconductor thin films. The J-c homogeneity of Φ2～3 inch superconducting thin films can be measured fast, accurately and non-destructively by utilizing J-c measuring instruments.;The principles of the instruments are to determine the J-c values by detecting the inductive voltage, which is induced by the superconducting transition of high-T-c thin films. The measuring coils are composed of the primary and the secondary ones. The signal frequency is 20kHz. Secondary signals are detected by lock-in amplifiers at the same frequency. All the measuring processes are controlled by computers.;High J-c and low R-s values are indispensable for high quality Φ2～3 inch double-sided superconducting thin films applied in superconducting filters. Measuring the J-c homogeneity of superconducting thin film and analyzing the relationship between J-c and R-s correspondingly are very important to the quality control of superconductor thin films.

关 键 词：高温超导 临界电流密度 超导薄膜 均匀性测量 无源微波器件 临界温度 

分 类 号：O484[理学—固体物理]