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机构地区:[1]中国工程物理研究院流体物理研究所,四川绵阳621999
出 处:《太赫兹科学与电子信息学报》2014年第5期775-778,共4页Journal of Terahertz Science and Electronic Information Technology
基 金:流体物理研究所发展基金资助项目(SFZ20120101)
摘 要:以爆轰实验中常用的电探针测试系统和激光干涉测速系统为例,研究接触测量与非接触测量对爆轰实验测试结果的影响。在平面爆轰波驱动金属飞片实验中,利用电探针测试飞片到达固定位置处的时刻,同时利用VISAR测试飞片飞行速度历史,对两者的测试数据进行对比分析,结果表明:光杆探针与卷筒探针的第一台阶测试结果一致,卷筒探针的第二台阶由于飞溅物等原因,比光杆探针提前导通约0.1μs;3个层面的光杆探针测试结果与任意反射表面的速度干涉仪(VISAR)测试结果一致。分析认为,在爆轰实验中,由于被测物体处于高温高压状态,且运动速度很快,接触测量产生的测力也将随之加大,在固定点位置,接触测量将对飞片上此点的后期运动产生明显影响;对于被测飞片的整体运动,由于电探针尺寸重量等远小于飞片,接触测量在固定点造成的影响对整个飞片来讲可以忽略不计,因此得到与非接触测量一致的测试结果。The influence of contact measurement and non-contact measurement on experiment results is studied by adopting electric probe and Velocity Interferometer System for any Reflector(VISAR) which are general measurement instruments in detonation experiment. The time when the metal flyer driven by plane detonation wave is reaching some point is measured by electric probes. Simultaneously, the free-surface velocity and displacement of the metal flyer are measured by VISAR for contrasting with electric probes. Experiment results show that the first stage probe of the ladder electric probe is coincident well with the single electric probe; the second stage probe of the ladder electric probe is conducted in advance by the sputtering objects, and it is earlier by about 0.1μs than the single electric probe. Experiment results measured by the single electric probe are coincident well with VISAR. The analysis indicates that, in a detonation experiment, the measured object is in hyperthermia and high pressure state with big velocity, and the measuring force increases in consequence; at the fixed point position on a flyer, the contact measurement would have a visible effect on later movement of that point, whereas this effect may be completely ignored with regard to the whole movement of the flyer, because the weight of electric probe is far less than that of the metal flyer; therefore, the results measured by contact measurement and non-contact measurement are coincident well.
关 键 词:爆轰 接触测量 非接触测量 电探针 任意反射表面的速度干涉仪
分 类 号:TN249[电子电信—物理电子学]
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