波长色散X射线荧光光谱法测定纯金中金  

WAVELENGTH-DISPERSION XRFS ANALYSIS OF PURITY OF GOLD

作　　者：吴奕阳[1] 叶晓珉[1] 方名戌[1] 

机构地区：[1]上海市计量测试技术研究院,上海200233

出　　处：《理化检验（化学分册）》2003年第11期639-640,共2页Physical Testing and Chemical Analysis(Part B:Chemical Analysis)

摘　　要：应用波长色散X射线荧光光谱法 (WDXRF)对纯金 (金含量为 98.0 0 %～ 99.95 % )中金含量进行定量分析。利用国家标准物质和自行研制的工作标样建立校准曲线 ,采用Lachance Trill浓度校正模式消除吸收 增强效应 ;进行背景修正以提高测低浓度组分的准确度。对样品的测试结果与其它方法结果比较 ,证明此法可行。金含量在 98.0 0 %～ 99.95 %范围内 ,分析结果与其他方法结果的偏差绝对值均小于 0 .10 %。The wave length dispersion XRFS method was applied to the determination of purity of gold metal of gold content between w (Au) 98.00%～99.95%. Calibration curve was established by using GBW standards and self prepared working standard. The accuracy of determination, especially for samples with relatively low gold contents, was improved by background correction. The absorption intensification effect was eliminated by the Lachance Trill concentration correction model. As compared with some other method, the WDXRFS was proved to be more simple and rapid, and the absolute deviations of results obtained by WDXRFS were less than 0.10% in comparing with results obtained by fire assay method, AAS method and ICP AES method. The gold contents of samples analyzed were in the range of w (Au)≥98.00% to 99.95%.

关 键 词：波长色散X射线荧光光谱法 纯金 背景修正 吸收-增强效应 Lachance-Trill浓度校正模式 

分 类 号：TG115.22[金属学及工艺—物理冶金] O657.34[金属学及工艺—金属学]