合肥光源逐圈测量系统试验结果及其在注入调试中的应用(英文)  

Experiment result of the turn-by-turn system and its application in HLS

作　　者：王筠华[1] 李为民[1] 刘祖平[1] 孙葆根[1] 刘建宏[1] 郑凯[1] 杨永良[1] 徐宏亮[1] 王琳[1] 尚雷[1] 贡顶[1] 

机构地区：[1]中国科学技术大学国家同步辐射实验室,安徽合肥230029

出　　处：《强激光与粒子束》2004年第1期101-104,共4页High Power Laser and Particle Beams

基　　金：SupportedbyNationalKeyProjectonScience PhaseⅡofNSRL&byNationalNaturalScienceProject (1 0 1 750 63)

摘　　要：　介绍了合肥光源(HLS)逐圈束流位置测量系统在升级后的注入系统联调中的作用。该逐圈测量系统信号处理器采用对数比电路,数据获取采用NI5102ADC。为了保证长达2s数据获取,采样数据通过突发的DMA方式实时写入工控机的系统内存。注入Kicker用作为激励束流,以便监测衰减率和研究β振荡。This paper introduces the turn-by-turn system of Hefei Light Source (HLS), and presents the analysis of the experiment results, as well as its application in commission of upgraded injection system of HLS. The signal processor of the system adopts a log-ratio electronics circuit. Up to 2s data acquisition is available. Injection kickers are used to excite beam for monitoring damping rate and β oscillation.

关 键 词：逐圈束流位置测量 衰减率 局部凸轨 残余β振荡 

分 类 号：TL594[核科学技术—核技术及应用]