卤族离子对银表面-分子系统中的表面增强Raman光谱信号的影响  

INFLUENCE OF HALOGEN FAMILY ANIONS ON SERS SIGNAL IN Ag SURFACE-MOLECULE SYSTEM

作　　者：苗润才[1] 潘多海[1] 陈发堂[1] 张新惠 

机构地区：[1]陕西师范大学物理系,西安710062

出　　处：《物理学报》1992年第9期1542-1546,共5页Acta Physica Sinica

基　　金：国家自然科学基金

摘　　要：本文研究了多种卤族元素对表面增强Raman光谱(SERS)信号的影响,给出SERS强度随不同卤离子浓度的变化关系及Raman特征峰强度反转现象,并对其机理进行了初步的分析。The influence of halogen family elements on the SERS signal was studied. The relation-shap between the SERS intensity and the concentration of halide and reversal phenomena of intensity of Raman peaks were discovered. Finally, some explanations were givea.

关 键 词：银 SERS 散射谱 VⅡA族元素 

分 类 号：O484[理学—固体物理]