钼单晶的判定及其偏离角的测试  

IDENTIFICATION OF Mo SINGLE CRYSTAL AND TEST OF THE DEVIATION ANGLE

作　　者：雷新颖[1] 郭让民[1] 李中奎[1] 郑欣[1] 张廷杰[1] 

机构地区：[1]西北有色金属研究院,西安710016

出　　处：《理化检验（物理分册）》2003年第6期295-297,共3页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘　　要：采用X射线θ扫描旋转法和金相分析相结合的方法 ,对区熔法生长的钼单晶样品进行了判定和 ( 111)晶面取向偏离角的测试 ,对钼单晶中的小角晶界进行了观察和分析。在钼单晶中 ,小角晶界可以在晶内结束 ,其两边的衬度不能在金相显微镜下区分。钼单晶的I θ曲线有一对规整的峰 ,峰的宽度很小 ,这表明晶界两边的晶粒取向差很小。所测试的钼单晶偏离角为 7.6°。上述结果表明 ,该方法对钼单晶测试和判定具有操作简单、测试快速 。A sample of Mo single crystal has been identified, and the orientation deviation angle of (111) plane has been measured. Low angle grain boundaries in the sample were observed and analyzed by means of rotating orientation XRD and optical microscopy. The low angle grain boundary may end in a Mo Single Crystal, the contrast of its two sides can not be distinguished with optical microscopy. I-θ curve of a Mo Single Crystal has two standard peaks and the widths of peaks are all narrower, which means the orientation deviation angle between the two side of low angle grain boundary is very small. Orientation deviation angle of the sample is 7.6°. It is found that simple method is suitable for identifying Mo single crystal, and the result of deviation angle is accurate.

关 键 词：钼单晶 取向偏离角 X射线扫描旋转法 金相分析 区熔法 探测器 晶体取向 

分 类 号：TG115.222.1[金属学及工艺—物理冶金]