原子力显微镜原理及磁畴测量  

AFM Principle and Inspection of Magnetic Domain

作　　者：李崇香[1] 池济宏[1] 冯浩[1] 牛振风[1] 茹明博 陈春梅[2] 楚春双 姜风伟[2] 

机构地区：[1]河北北方学院现代光学研究所,河北张家口075000 [2]河北北方学院理学院物理系

出　　处：《河北北方学院学报（自然科学版）》2015年第4期24-27,32,共5页Journal of Hebei North University:Natural Science Edition

基　　金：河北北方学院新技术跟踪项目(120185)

摘　　要：通过对原子力显微镜工作机理及磁畴理论的研究,应用原子力显微镜的磁畴测量功能检测软盘、硬盘、超磁致伸缩材料TDF等磁性材料的磁畴,并进行相应的分析。为进一步研究磁存储材料及磁致伸缩材料的磁畴特性打下基础。The authors studied atomic force microscope (AFM)and magnetic domain theory.With the inspectional function of magnetic property attached by AFM,the magnetic floppy disk,magnetic hard disk,and giant magnetostrictive material TDF were inspected.The magnetic domain structures of these materials were obtained by AFM inspection.The magnetic domain images observation,detection and a-nalysis were done.The study is useful for the further study of magnetic properties with different magnetic disks and giant magnetostrictive material-TDF.

关 键 词：原子力显微镜 磁畴 磁盘 超磁致伸缩材料 

分 类 号：TH742[机械工程—光学工程]