微波管用氧化铝陶瓷真空耐压性能及测试方法研究  

Studies of the Vacuum Surface Flashover and the Corresponding Measuring Method of Alumina Insulators Used for Microwave Tubes

作　　者：尚阿曼[1] 田志英[1] 张巨先[1,2] 

机构地区：[1]北京真空电子技术研究所,北京100015 [2]微波电真空器件国家级重点实验室,北京100015

出　　处：《真空电子技术》2015年第3期34-38,共5页Vacuum Electronics

摘　　要：本文根据微波管用氧化铝陶瓷的使用条件,对氧化铝陶瓷绝缘子真空耐压性能的测试方法进行了研究,同时还研究了测试系统真空度对陶瓷耐压性能的影响。此外,利用本文确定的测试方法,对不同工艺制备的氧化铝陶瓷真空耐压性能进行了测试,结果发现采用不同工艺制备的氧化铝陶瓷真空耐压性能存在显著差异。The measuring method of vacuum surface flashover on alumina insulators was studied according to the using condition in microwave tubes.The influence of vacuum environment in measurement equipment on surface flashover was also investigated.Vacuum surface flashover of alumina insulators produced by different fabrication processes was measured by the determined measuring method.The result showed that the alumina insulators have obviously different vacuum withstanding voltage properties.

关 键 词：氧化铝陶瓷 真空耐压性能 沿面闪络 测试方法 

分 类 号：TN105[电子电信—物理电子学]