基于电路状态信息和冲突分析的部分扫描设计  

Partial Scan Design Based on Circuit State Information and Conflict Analysis

作　　者：向东[1] 刘鑫[1] 徐奕[1] 

机构地区：[1]清华大学微电子学研究所,北京100084

出　　处：《电子与信息学报》2004年第1期124-130,共7页Journal of Electronics & Information Technology

基　　金：国家自然科学基金(No.69773030);985国家教委基础研究基金资助课题

摘　　要：该文提出了一种割断关键回路的方法来选择扫描触发器。该方法在选择一定数量的扫描触发器后,采用逻辑模拟更新电路的状态信息,这样可以得到更为精确的可测试性信息。当电路中的关键回路割断后,转向消除冲突的处理,而不是降低时序深度。该方法致力于消除冲突,并使用了一种基于冲突分析的测度conflict.足够的实验结果表明该方法是非常有效的。A multiple phase partial scan design method that breaks critical cycles using a combination of valid circuit state information and conflict analysis is proposed. It is quite cost-effective to obtain circuit state information via logic simulation, therefore, circuit state information is iteratively updated after a given number of partial scan flip-flops being selected. When all critical cycles in the circuit are broken, our method turns to the conflict resolution process using an intensive conflict-analysis-based testability measure conflict rather than reducing the sequential depth. The proposed method tries to eliminate the conflicts and uses a conflict-analysis-based testability measure conflict. Sufficient experimental results are presented to validate the method.

关 键 词：电路状态信息 冲突分析 扫描设计 大规模集成电路 高度时序化 有效状态 

分 类 号：TN47[电子电信—微电子学与固体电子学]