纳米体系粒度分布的X射线小角散射表征  

Characterization of Particle Size Distribution of Nanometer System by Small Angle X-ray Scattering Method

作　　者：张晋远[1] 郑毅[1] 朱瑞珍[1] 

机构地区：[1]钢铁研究总院纳米材料工程技术研究中心,北京100081

出　　处：《现代科学仪器》2003年第2期3-8,共6页Modern Scientific Instruments

摘　　要：本文简要介绍了国内外有关粒度分析标准的制定状况 ;重点描述了X射线小角散射法测定纳米粉末粒度分布的基本原理 ,数据处理方法和结果的实验验证 ;A brief introduction on the situation of particle size analysis standards is reported. The basic principle, data treatment and experimental verification of small angle X ray scattering for determining particle size distribution has been especially described. The peculiarities and problems concerned of the method are also discussed.

关 键 词：纳米颗粒 粒度分布 X射线小角散射 

分 类 号：TB383[一般工业技术—材料科学与工程]