非晶态Ni_(85-x)Si_(15)B合金的结构弛豫对电阻特性的影响  

THE INFLUENCE OF STRUCTURAL RELAXATION ON RESISTANCE PROPERTIES OF AMORPHOUS Ni_(85-x)Si_(15)B_x ALLOYS

作　　者：王玲玲[1] 胡望宇[1] 刘让苏[1] 吴力军[1] 

机构地区：[1]湖南大学应用物理系,长沙410012

出　　处：《湘潭矿业学院学报》1992年第2期184-187,共4页Journal of Xiangtan Mining Institute

摘　　要：本文研究了非晶态Ni_(85-x)Si_(15)Bx合金的结构弛豫对电阻特性的影响。通过等时退火和等温退火两种实验方法研究了室温电阻率和电阻温度系数随退火温度及退火时间的关系。用近自由电子模型及Nagel推广的Ziman理论对实验结果进行了初步分析和讨论。图2,参6。The influence of structural relaxation on resistance properties of amorphous Ni_(85-x) Si_(15)B_x alloys have been studied. The raiation between the resistivity at room temperature or the temperature coefficient of resistance and annealed temperature or an nealed time have been investigated by isothermal and isochronous heat treatment. The ex perimental results are Nagel generalized Ziman theory. 2figs, 6refs.

关 键 词：金属玻璃 弛豫 电阻率 

分 类 号：TG139.8[一般工业技术—材料科学与工程]