适用于电子器件寿命测试的威布尔分布函数的导出  

The Deduction of Weibull Function Suited for Lifetime Test of Electronic Devices

作　　者：孙振东[1] 王喜山[2] 

机构地区：[1]烟台大学 [2]青岛大学

出　　处：《烟台大学学报（自然科学与工程版）》1992年第1期67-69,66,共4页Journal of Yantai University(Natural Science and Engineering Edition)

摘　　要：本文在拉应力、电应力为变量的威布尔分布函数的基础上.从三个角度分析并导出了寿命试验和加速寿命试验中以时间为自变量的威布尔分布函数.已证明它与实验吻合并可用于测量电子器件寿命。In this paper Weibull functions with mechanical and electrical stress variables was introduced. Another Weibull function with time variable on ordinary and accelerated life tests was obtained. It had been proved by the author that this function is congruous with the tests and it can be used in lifetime tests of electronic devices.

关 键 词：威布尔分布 电子器件 寿命 测试 

分 类 号：TN606[电子电信—电路与系统]