玻璃盘基对高密度硬盘介质静态磁性参数测量的影响和消除方法  

Influence of Glass Substrate on Measuring of Static Magnetic Parameters of High-density Hard-disk Media and Its Eliminating Methods

作　　者：游龙[1] 宋敏[1] 李震[1] 

机构地区：[1]华中科技大学电子系,湖北武汉430074

出　　处：《磁性材料及器件》2004年第1期44-46,共3页Journal of Magnetic Materials and Devices

基　　金：教育部博士点基金点资助项目(20010487021)

摘　　要：高密度硬盘介质静态磁性参数的精确测量对研制高密度硬盘至关重要。本文从测量系统和材料两方面对玻璃基噪声的影响机理做了较详尽的分析;并介绍了消除玻璃基噪声影响的四种方法,这四种方法在测量同一硬盘介质静态磁性参数时相对偏差小于5%,因此这四种方法都是切实可行的。Accurate measurement of static magnetic parameter of high-density hard-disk media is vital for research and development of high-density hard-disk. This paper analyses the influence of glass substrate noise from measuring system and media at large. Four methods of eliminating glass substrate noise are introduced. Comparative error among these methods is less than 5% for same media of hard-disk. So the four methods are executable.

关 键 词：高密度硬盘 玻璃基 静态磁性参数 磁滞回线 

分 类 号：TQ587.22[化学工程—精细化工]