类氦Ar^(16+)离子的高双激发态的俄歇宽度  

AUGER RATES OF HIGH DOUBLY EXCITED STATE OF MULTIPLY CHARGED HELIUM-LIKEAr^(16)+IONS

作　　者：芶秉聪[1] 

机构地区：[1]北京理工大学应用物理系

出　　处：《原子与分子物理学报》1992年第2期2239-2246,共8页Journal of Atomic and Molecular Physics

基　　金：北京理工大学青年科学基金

摘　　要：本文采用有限的组态相互作用方法计算了两电子主量子数均很大(N≥6)的类氦Ar^(16+)高双激发态的能量,俄歇宽度。讨论了俄歇跃迁率随内电子主量子数N,以及俄歇宽度随双Rydberg系列和转动系列的变化规律。对可能跃迁的末态,指出俄歇过程有近似的选择定则△v=v_f-v_i=0这儿v是双激发态的带振动量子数。The Auger rates of doubly excited states of positive ions with the principal quantum numbers of both electrons being larger (≥6) have been studied using a restricted-configuration-interaction method. The partial Auger rates to final states have been calculated for doubly excited states of Ar16+ . Systematics of the Auger rates along the double-Rydberg series and along the rotor series were investigated.It is shown that the propensity rule for Auger decay is △v = vf-v1=0,where v is the bending vibrational quantum number of the doubly excited state.

关 键 词：类氦离子 激发态 俄歇宽度 氩离子 

分 类 号：O562.1[理学—原子与分子物理]