利用光纤Bragg光栅测量压电晶体的特性曲线  

The Measurement of the Characteristic Curve of Piezocrystal with Fiber Bragg Grating

作　　者：李志全[1] 吴飞[1] 蔡璐璐[1] 

机构地区：[1]燕山大学,秦皇岛066004

出　　处：《仪器仪表学报》2004年第1期111-112,124,共3页Chinese Journal of Scientific Instrument

摘　　要：应用逆压电效应 ,在低频直流条件下 ,提出利用光纤 Bragg光栅测量压电晶体的特性曲线。推导出了 Bragg反射波长λB随应力变化的关系式 ,并设计了合理的结构以直接测量 PZT的位移量。通过实际测量给出的 PZT电压—位移曲线表明 :该系统测量方法结构简单 ,测量精度高 ,能进行实时测量。Using the converse piezoelectric effect, the characteristic curve of piezocrystal with fiber Bragg grating under low frequency and direct current condition is analyzed. The function of Bragg reflected wavelength λ B against the strain is obtained, and the reasonable structure which is used for the direct measurement of the displacement of PZT is designed. The characteristic curve of PZT given by the actual measuring proves that this system with simple structure can complete high precise and on-line measurement.

关 键 词：压电晶体 特性曲线 逆压电效应 动态特性 光纤BRAGG光栅 光纤光栅 测量 

分 类 号：TN384[电子电信—物理电子学]