电化学原子力显微镜的应用  

Application of Electrochemical Atomic Force Microscopy

作　　者：李晓军[1] 何品刚[1] 方禹之[1] 胡均[2] 李名乾[2] 

机构地区：[1]华东师范大学化学系,上海200062 [2]中国科学院上海原子核研究所,上海201800

出　　处：《分析化学》2004年第3期395-401,共7页Chinese Journal of Analytical Chemistry

摘　　要：评述了电化学原子力显微镜的原理和技术及其在现场电化学和电分析化学领域的应用 ,如观察电镀、腐蚀和防腐的过程 ,电化学沉积膜的形成和特点 ,测定两表面间的静电力等 ,指出其存在的一些缺陷 ,并对经过改造后的电化学原子力显微镜进行了综述。The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed.The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM.

关 键 词：电化学原子力显微镜 现场电化学 电分析化学 工作原理 工作电极 电镀 腐蚀 防腐 电池反应 

分 类 号：O657.1[理学—分析化学]