利用深度探测函数研究双层介质的空间分辨漫反射率  

Diffusing Reflectance from Two-layered Medium Based on the Depth Detected Function

作　　者：刘迎[1] 胡佑周[1] 陈红军[1] 

机构地区：[1]天津大学理学院光电信息技术科学教育部重点实验室,天津300072

出　　处：《光电子．激光》2004年第3期369-371,共3页Journal of Optoelectronics·Laser

基　　金：国家自然科学基金资助项目(60278004)

摘　　要：提出了一种研究双层介质空间分辨漫反射率的理论模型。考虑到不同深度分布的光子对探测信号的贡献不同,引入深度探测函数α(z,ρ),用其描述探测光子与散射介质空间面的相互作用,进而提出了一种研究双层散射介质空间分辨漫反射率的理论方法。给出了双层散射介质的空间分辨漫反射率的理论分析结果,并与MonteCarlo模拟结果进行比较,结果表明两者符合得较好。A new method was raised for studying spatial-resolved diffusing reflectance from two-layered medium.Considering the contribution of photons moving in different depth to the detected signal,a function called as the detected depth function,which is the probability of signal photon came from one medium layer,was introduced to investigate two-layered media.The results were presented by new method and agree with Monte Carlo simulation.

关 键 词：深度探测函数 双层介质 空间分辨漫反射率 激光医学诊断 

分 类 号：R318.51[医药卫生—生物医学工程]