用热表面电离质谱法测量高电离电位元素锑同位素丰度  

Measurement of Sb Isotope Abundance by TIMS

作　　者：王军[1] 赵墨田[1] 

机构地区：[1]国家标准物质研究中心

出　　处：《质谱学报》1992年第1期36-39,共4页Journal of Chinese Mass Spectrometry Society

摘　　要：本文叙述用热电离质谱计对高电离电位元素锑进行测量时,选用硅胶和磷酸作为增强剂,实现了锑的热电离。通过严格控制样品蒸发和电离温度,克服^(137)Ba的干扰,取得了满意的测量结果。The measurement of isotope aboundance of high ionization potential element Sb by thermal ionization mass spectrometry (TIMS) is described in this paper. Silica gel and phosphoric acid were used as ionization enhancement agent. When the filament temperature being strictly controlled to remove the interference from ^(137)Ba, good results were obtained.

关 键 词：热表面电离 质谱法 锑 同位素丰度 

分 类 号：O657.6[理学—分析化学]