LD加速寿命测试中的积分球扫描法  

Integrating cavity scanning used in laser diode accelerating life test

作　　者：苏美开[1] 高稚允[1] 田柯文 刘秉琦[1] 左日方 

机构地区：[1]北京理工大学信息科学技术学院光电工程系,北京100081 [2]济南军区军械雷达修理所

出　　处：《光学技术》2004年第2期164-165,共2页Optical Technique

摘　　要：介绍了半导体激光二极管(LD)寿命测试中存在的问题,并据此给出了LD高温加速寿命测试的积分球扫描法。首先将LD输出的光通过积分球耦合,然后再通过光纤耦合到探测器(PD)上,避免了LD和PD由于同时老化而带来测量不准确的缺陷。采用积分球空间移动扫描测量LD,可实现单个积分球、单个PD对多个LD的测量。The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test. The method couples the LDs beam to the IC and couples to the photoelectric detector (PD) through optics fibers, and protects PDs burning-in from to bring errors of testing. At the same time, because of ICS in space, the testing is finished with single IC and single PD, and the testing fee is saved.

关 键 词：激光二极管 寿命测试 积分球耦合 积分球扫描 LD 

分 类 号：TN312[电子电信—物理电子学]