粉状石墨的X射线线形分析  

X-RAY DIFFRACTION LINE-PROFILE ANALYSIS ON THE POWDERED GRAPHITE

作　　者：徐跃[1] 朱涛[2] 郝兆印[3] 

机构地区：[1]吉林大学测试中心,长春130023 [2]吉林大学超分子结构与材料教育部重点实验室 [3]吉林大学超硬材料国家重点实验室

出　　处：《金刚石与磨料磨具工程》2004年第2期75-77,共3页Diamond & Abrasives Engineering

摘　　要：采用X射线线形分析方法对经过两种不同化学方法和石墨化温度 (2 770K)处理的 4个粉状石墨 (1# 至 4# )试样进行了分析计算 ,计算结果显示这 4个粉状石墨试样的晶粒尺寸基本保持不变 ,微观应变增加 ,位错密度减小。对石墨化过程结构的变化机制进行了分析。Before and after the process of heating to grahitization temperature 2770K, the structure of powdered graphite treated with acid and acid base was analysed by X ray diffraction line profile method. The results showed that grain sizes of powdered graphite got no obvious change and the strain energy was increased while the dislocation density decreased. The mechanism of structure change in the process of graphitization was discussed also.

关 键 词：粉状石墨 X射线线形分析 微观应变 合成 金刚石 

分 类 号：TQ163[化学工程—高温制品工业]