双相材料中相间内应力的X射线测量与表征  

MEASUREMENT AND REPRESENTATION OF THE INTER-PHASE STRESS FOR DOUBLE-PHASE MATERIAL BY X-RAY METHOD

作　　者：姜传海[1] 程凡雄[1] 吴建生[1] 

机构地区：[1]上海交通大学材料科学与工程学院高温材料及高温测试教育部重点实验室,上海200030

出　　处：《金属学报》2004年第4期351-354,共4页Acta Metallurgica Sinica

基　　金：国家自然科学基金项目50131030;上海应用材料研究与发展基金项目0211资助

摘　　要：基于X射线应力测量原理,建立了一种双相材料相间内应力的测量与表征方法.利用衍射谱线上两相的衍射峰位差, 有效地消除了仪器的系统误差.测量了实际材料SiCp/6061Al中的相间内应力,证实该方法具有较高的测量精度.Based on the theory of X-ray stress measurement, a method of measurement and representation for the inter-phase stress of double-phase material was established. The systematic error of the instrument has been effectively reduced by the difference between diffraction angles of two phases. The inter-phase stress of an actual material (SiCP/6061AI composites) was measured, and it was verified that this method has a high measuring precision.

关 键 词：双相材料 相间内应力 X射线应力测量 

分 类 号：TG115.22[金属学及工艺—物理冶金]