X射线法测试Be应力的影响因素分析  

Effects on Measured Stress in Be by X-Ray Stress Analysis

作　　者：李瑞文[1] 董平[1] 

机构地区：[1]中国工程物理研究院,四川绵阳621900

出　　处：《稀有金属》2004年第1期139-141,共3页Chinese Journal of Rare Metals

摘　　要：根据X射线法测量应力原理 ,结合Be力学参数特点 ,分析了衍射晶面选择、应力梯度以及覆盖物等对应力测量结果的影响 ,同时还分析了铍材性能和处理工艺对应力的影响。结果表明 ,衍射晶面、应力梯度和处理工艺对应力值变化影响很大 ,测试结果不确定度相对较大。Based on principle of measured stress by X ray and Be mechanical properties, the effects of crystal orientation and stress gradient and the cover on measured stress value were studied. The mechanical properties and processing of Be were also investigated. The results show that the measured stresses are strongly affected by crystal orientation and stress gradient and processing. The uncertainty of stresses result is relatively serious.

关 键 词：铍 残余应力 X射线应力分析 

分 类 号：TL34[核科学技术—核技术及应用]