基于硅色敏器件的单色光波长测量系统的设计  

Measurement System Design of Monochromatic Wavelength Based on Si Color Sensor

作　　者：季峰[1] 陈炳若[1] 

机构地区：[1]武汉大学物理科学与技术学院,湖北武汉430072

出　　处：《半导体光电》2004年第2期128-131,共4页Semiconductor Optoelectronics

基　　金：湖北省科技厅重点攻关课题(2002AA101B06).

摘　　要：介绍了基于硅双结型色敏器件的单色光波长测量系统的硬件、软件设计。该系统以微处理器为控制单元、硅双结型色敏器件为探测器,实现了对单色光波长方便、快捷、准确的测量。A design for wavelength measurement system, including new hardware and software, based on Si bipolar junction color sensor is presented. The controller of the system is a microprocessor and the detector is Si bipolar junction color sensor. The system can be used to measure the monochromatic wavelength conveniently, rapidly and exactly.

关 键 词：硅双结型色敏器件 单色光波长 系统定标 微处理器 

分 类 号：TN364[电子电信—物理电子学]