高频介质系统介电性能与相组成的定量关系分析  

Analysis on Quantitative Relationship between Dielectric Properties and Phase Structure of High Frequency Dielectric System

作　　者：李玲霞[1] 吴霞宛[1] 王洪儒[1] 张志萍[1] 余昊明[1] 

机构地区：[1]天津大学电子信息工程学院,天津200072

出　　处：《物理化学学报》2004年第4期396-399,共4页Acta Physico-Chimica Sinica

基　　金：国家自然科学基金(50172035)资助项目~~

摘　　要：采用普通电子陶瓷工艺制备两种高频介质系统ZnO-B2O3-SiO2三元系和Bao-Pbo-Nd2O3-Bi2O3-TiO2五元系,通过XRD分析确定各系统的主晶相,运用衍射峰强度计算法准确测定出各组分的体积百分含量,并代入Lichnetecker对数混合定则,计算出系统的介电性能,获得了分析介质系统介电性能与物相含量之间定量关系的新方法.Two high frequency dielectric systems of ZnO-B2O3-SiO2 and BaO-PbO-Nd2O3-Bi2O3-TiO2 were prepared by conventional ceramics technology. Through XRD analysis, the main crystal phases were determined. The volume percentage contents of each phase were calculated according to the X-ray diffraction peak intensity. Then, these data were introduced into Lichnetecker Law, from which the dielectric properties of the systems were obtained. This is a new way to analyze quantitative relationship between the dielectric properties and phase contents of dielectric materials.

关 键 词：高频介质系统 介电性能 相组成 定量关系 衍射峰强度 陶瓷材料 

分 类 号：TQ174[化学工程—陶瓷工业]