微型柱分离-ICP-MS法测定高纯氧化铽中14个稀土杂质元素  

Micro-column separation-ICP-MS determination of 14 REE impurities in highly-purified Tb_4O_7

作　　者：李继东[1] 伍星[1] 郑永章[1] 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《分析试验室》2004年第4期73-76,共4页Chinese Journal of Analysis Laboratory

摘　　要：研究了微型柱分离 电感耦合等离子质谱法(ICP MS)测定高纯Tb4O7中痕量Lu的方法,采用Cyanex272负载树脂微型分离柱,选定了分离大量Tb4O7基体的实验条件,分离周期为40min。建立了微型柱分离Tb后测定Lu以及内标补偿法直接测定其它稀土杂质的高纯Tb4O7中14个稀土杂质元素的ICP MS分析方法。方法检出限为0.003～0.10μg g,加标回收率为86.6%～114%,相对标准偏差为1.1%～18%。方法可满足快速测定99.999%Tb4O7中14个稀土杂质元素的要求。A method of micro-column separation-ICP-MS determination of trace Lu in highly purified Tb_4O_7 was studied. By adopting Cyanex272 loaded resin column and optimized separation conditions, 14 REE impurities in highly purified Tb_4O_7 were separated and determined by direct ICP-MS method using an internal standard. The detection limits for REE were 0.003～0.10 μg/g, the precisions of measurements were 1.1%～18% RSD, and the recoveries of standard addition were 88.8%～110.8%. It was applied to the determination of REE impurities in Tb_4O_7 samples with purity of 99.999%.

关 键 词：电感耦合等离子体质谱 TB4O7 稀土杂质元素 氧化铽 

分 类 号：O614.341[理学—无机化学] O657.63[理学—化学]