硫增感AgBrI T颗粒乳剂光电子行为研究  

Application of Microwave Phase-Sensitive Technique in the Study of Photoelectron Action in the Sulfur-Sensitized T-Grains AgBrI Emulsion

作　　者：陆晓东[1] 李晓苇[2] 

机构地区：[1]嘉应学院物理系,广东梅州514015 [2]河北大学物理科学与技术学院,河北保定071002

出　　处：《感光科学与光化学》2004年第3期202-210,共9页Photographic Science and Photochemistry

基　　金：国家自然科学基金(10274017);教育部重点科研项目(01011).

摘　　要：利用微波相敏技术,获得了硫增感AgBrIT颗粒乳剂中自由光电子和束缚光电子时间衰减信号,分析了光电子衰减时间、电子陷阱效应、光电子寿命、有效陷阱深度及束缚电子转移时间与增感时间的关系,获得了最佳的增感时间、衰减时间、电子陷阱效应、光电子寿命、有效陷阱深度和转移时间数值.By microwave phase-sensitive technique, the instantaneous decay signals of free electrons and trapped electrons in AgBrI, which was sulfurized, were obtained. The relationships between sulfurizing time and the decay time of photoelectrons, the effects of electron traps, the lifetime of photoelectrons, the effective depth of traps and the transfer time of trapped electrons, were analyzed. From the experiment results, we got the best values of sulfurizing time, photoelectron decay time, effect of traps, lifetime of photoelectron, effective depth of traps and transfer time of trapped electrons.

关 键 词：微波相敏 自由载流子 束缚载流子 寿命 

分 类 号：TQ57[化学工程—精细化工]