防灰雾剂对T-颗粒乳剂晶体表面形貌的影响  

The Effect of an Antifoggant on the Surface Morphology of T-Grain Crystals

作　　者：曹立志[1] 梁笑丛[1] 庄思永[1] 

机构地区：[1]华东理工大学精细化工研究所,上海200237

出　　处：《感光科学与光化学》2004年第3期190-194,共5页Photographic Science and Photochemistry

基　　金：国家自然科学基金资助项目(20073013).

摘　　要：应用原子力显微镜对硫加金化学增感后的T 颗粒掺杂乳剂晶体表面形貌进行观察,直接测得了晶体颗粒的大小和厚度.颗粒表面精细结构观察显示样品表面并不平整,存在很多突起.这些突起呈线形平行排列,接近网格状.经曝光后突起变得更高,更集中.表面吸附足量的防灰雾剂后,晶体表面突起不明显.曝光后表面高度变化不大.The morphology of the doped T-grain after sulfur plus gold sensitized was observed by AFM.The size and the thickness of the crystal were obtained directly.The fine morpology of the surface of the T-grain showed that the surface was not flat,there were a number of protrusions,which were linearly arranged,like a network.After a long time exposure,the protrusions grew higher and gathered together.When the antifoggant was adsorbed on the surface of the crystal,few protrusions were found.After the exposure,the morphology of the surface changed little.

关 键 词：原子力显微镜 T-颗粒晶体 晶体形貌 防灰雾剂 吸附 

分 类 号：TQ57[化学工程—精细化工]