铍材应力常数的X射线法测试  

Measurement of X-ray Stress Constant of Beryllium

作　　者：董平[1] 陈勇忠[1] 柏朝茂[1] 

机构地区：[1]中国工程物理研究院,四川绵阳621900

出　　处：《稀有金属材料与工程》2004年第4期445-448,共4页Rare Metal Materials and Engineering

基　　金：中国工程物理研究院技术基金资助(990338)

摘　　要：在X2001应力分析仪上采用悬臂梁加载法测试了可以用于铍的X射线应力测试的5个衍射晶面的应力常数。结果表明,铍的5个衍射晶面的应力常数差异较大,在进行X射线应力分析时,应采用相应衍射晶面的应力常数,才能获得准确的应力分析结果。由于X射线对铍有较大的穿透深度,必须考虑X射线穿透深度对应力常数标定的影响。The X-ray stress constants of five crystalline planes of beryllium were measured by using a cantilever beam loading method on X2001 stress analyzer. The results show that the X-ray stress constant of each plane in beryllium is different, so the X-ray stress constant corresponding to a diffraction plane must be adopted in order to acquire the exact stress value on X-ray stress analysis. Because of the rather large penetrate depth of X-rays into beryllium, that effect on X-ray stress constant measurement must be taken into account. Key words: beryllium; x-ray diffraction; stress constant; penetrate depth

关 键 词：镀 X射线衍射 应力常数 穿透深度 

分 类 号：TG115[金属学及工艺—物理冶金]