一种有效的双矢量测试BIST实现方案  

An Efficient BIST Scheme for Two-Pattern Test

作　　者：张金林[1] 陈朝阳[1] 沈绪榜[1] 张晨[1] 

机构地区：[1]华中科技大学图象识别与人工智能研究所教育部重点实验室,湖北武汉430074

出　　处：《微电子学与计算机》2004年第4期116-120,共5页Microelectronics & Computer

基　　金：国家自然科学基金项目(70209020)

摘　　要：文章提出了一种简单有效的双矢量测试BIST实现方案,其硬件主要由反馈网络可编程且种子可重置的LF鄄SR和映射逻辑两部分构成。给出了一种全新的LFSR最优种子及其反馈多项式组合求取算法,该算法具有计算简单且容易实现的特点。最后,使用这种BIST方案实现了SoC中互联总线间串扰故障的激励检测,证明了该方案在计算量和硬件开销方面的优越性。This paper presented an more efficient BIST scheme for two-pattern test based on the in-depth research of the advantages and disadvantages of the already presented scheme, the framework of the presented BIST scheme is constituted by the linear feedback shift registers (LFSR) and the corresponding mapping logics. In addition, we put forward a new and efficient arithmetic to compute the best combinations of the seeds and the feedback polynomials of LFSR. In the last part of the paper, we used this presented BIST scheme to implement the Maximal Aggressor Fault model (MAF) for the crosstalk faults on SoC interconnects, which is a typical two-pattern test problem. The results show the superiority of this presented BIST scheme for two-pattern test in the area overhead and the computing complexity.

关 键 词：SOC测试 内建自测试(BIST) 双矢量测试 MAF 模型 

分 类 号：TN361[电子电信—物理电子学]