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作 者:丁莉莉[1] 卢汉斌[1] 周蓉[1] 万家亮[1]
出 处:《分析科学学报》2004年第3期254-256,共3页Journal of Analytical Science
摘 要:本文详细研究了0.1%Ca和0.1%Mg基体在端视ICP中对激发电位不同的谱线的干扰效应;对端视与侧视ICP中的基体干扰进行了比较;探讨了主要工作参数对基体干扰的影响。结果表明,在Ca、Mg基体存在时,大部分待测元素的谱线受到抑制,并且激发电位较高的谱线受抑制程度较大;侧视ICP中基体干扰比端视ICP中略好;适当增大功率和选择合适的载气流量可减少Ca或Mg基体的干扰。Ca and Mg interference effects in axially and radially viewed ICP were compared for a wide range of spectral lines with different excitation potentials. Interference effects in axially viewed ICP were larger than those in radially viewed ICP. It was shown that most of spectral lines were suppressed in the presence of Ca and Mg, and the intensities of high excitation potential lines were inhibited to a greater extent. Also, interference effects became more servere with increasing Ca and Mg concentrations. However, the interferences of Ca and Mg could be reduced by the increase of rf power or selection of suitable carrier gas flow rate.
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