多种在系统可编程器件数字测试系统  

The Design of Multiple in System Programmable Digital Testing System

作　　者：陈久元 王道德 吴文全[1] 

机构地区：[1]海军工程大学

出　　处：《电子测量技术》2004年第2期55-56,共2页Electronic Measurement Technology

摘　　要：文中提出了以多种在系统可编程逻辑器件为核心的应用测试平台,阐述其设计思路和设计要点,同时给出系统的实用示例电路。该平台的实现,克服可编程器件开发环境的单一性,为应用在系统可编程技术提供操作平台,为数字系统设计中新增设的 PLD技术教学内容提供实验环境。In this paper, a developing testboard which centre uses multiple programmable logic devices is presented and its design thoughts and points are simply introduced,. At the same time, an example is given. The realization of the testboard which overcomes its single developing environment , provides a operating and developing board for the PLD technology, and provides a applicated environment for the new PLD technology of digital circuit and system design.

关 键 词：在系统 可编程逻辑器件 EDA 数字测试 

分 类 号：TN791[电子电信—电路与系统]