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作 者:FANGJie WANGJing-guang HONGZhi-liang
机构地区:[1]Dept.ofMicroelectron.,FudanUniversity,Shanghai200433,CHN
出 处:《Semiconductor Photonics and Technology》2004年第2期133-137,140,共6页半导体光子学与技术(英文版)
摘 要:A 320×240 CMOS image sensor is demonstrated,which is implemented by a standard 0.6 μm 2P2M CMOS process.For reducing the chip area,each 2×2-pixel block shares a sample/hold circuit,analog-to-digital converter and 1-b memory.The 2×2 pixel pitch has an area of 40 μm×40 μm and the fill factor is about 16%.While operating at a low frame rate,the sensor dissipates a very low power by power-management circuit making pixel-level comparators in an idle state.A digital correlated double sampling,which eliminates fixed pattern noise,improves SNR of the sensor, and multiple sampling operations make the sensor have a wide dynamic range.A 320×240 CMOS image sensor is demonstrated,which is implemented by a standard 0.6 μm 2P2M CMOS process.For reducing the chip area,each 2×2-pixel block shares a sample/hold circuit,analog-to-digital converter and 1-b memory.The 2×2 pixel pitch has an area of 40 μm×40 μm and the fill factor is about 16%.While operating at a low frame rate,the sensor dissipates a very low power by power-management circuit making pixel-level comparators in an idle state.A digital correlated double sampling,which eliminates fixed pattern noise,improves SNR of the sensor, and multiple sampling operations make the sensor have a wide dynamic range.
关 键 词:CMOS image sensor Digital image sensor PHOTODIODE Analog-to-digital converter Correlated double sampling Fixed pattern noise
分 类 号:TN911.73[电子电信—通信与信息系统] TP212[电子电信—信息与通信工程]
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