高斯界面背向散射超声散斑复振幅统计特性  

Statistical properties of complex amplitude of ultrasonic speckles back scattered from a Gaussian interface

作　　者：吴艳阳[1] 朱鸿茂[1] 王寅观[2] 

机构地区：[1]华中科技大学力学系,武汉430074 [2]同济大学声学研究所,上海200092

出　　处：《声学学报》2004年第3期249-253,共5页Acta Acustica

基　　金：国家自然科学基金资助项目(10074017)

摘　　要：对超声入射在高斯型弱散射界面上时,背向散射空间中超声散斑复振幅的一些统计特性进行了理论分析,根据连续界面条件,推导出了散斑复振幅实部和虚部的均值和方差的函数表示式。进一步的分析表明,当高斯界面的粗糙程度逐渐变为很小或很大时,描述超声散斑复振幅这些特性的函数表示式就分别与光滑界面或强散射界面生成的声场相应特性的表示式完全一致。Some statistical properties of complex amplitude of the ultrasonic speckles back scattered from a Gaussian interface which is insonified by ultrasound is analyzed theoretically. Based on the condition of continuous interface, the mean functions and the variance functions of the real part and the imaginary part of the complex amplitude of the ultrasonic speckles are deduced. The further analyses show that when the roughness of a Gaussian interface becomes extremely small or extremely large, these functions change to be identical with that deduced from a smooth interface or a strongly scattering interface.

关 键 词：高斯界面 背向散射 超声散斑 复振幅统计 光滑界面 

分 类 号：O422[理学—声学]