应用同步辐射白光形貌术研究Nd:SGG晶体的缺陷  

Investigations on defects of Nd:SGG laser crystal by using synchrotron radiation white-beam topography method

作　　者：丁嘉瑄[1] 徐家跃[1] 肖敬忠[2] 田玉莲[3] 朱佩平[3] 袁清习[3] 

机构地区：[1]中国科学院上海硅酸盐研究所 [2]复旦大学物理系 [3]中国科学院高能物理研究所北京100039

出　　处：《核技术》2004年第7期481-484,共4页Nuclear Techniques

摘　　要：应用同步辐射X射线形貌术对坩埚下降法生长的Nd:SGG晶体的缺陷进行了研究。观察到该晶体中存在较为明显的镶嵌结构晶界缺陷和位错缺陷,并分析了上述缺陷的形成原因。对提高Nd:SGG晶体质量、改进生长工艺具有一定的参考价值。A synchrotron radiation white-beam topography experiment has been performed to investigate the defects of Nd:SGG laser crystals grown by Bridgman method for the first time. Clear images of some defects, such as boundaries and dislocations were observed. The formation mechanism of these defects was discussed. It's anticipated that the results of this work will be useful for optimizing the growth conditions of Nd:SGG laser crystals.

关 键 词：Nd:SGG 激光晶体 同步辐射白光形貌术 晶体缺陷 

分 类 号：O723[理学—晶体学]