微分脉冲极谱测定痕量铊的研究  

Determination of Trace Amounts of Thallium by Differential Pulse Polarographiy

作　　者：何为[1] 范中晓[1] 霍彩红[1] 

机构地区：[1]电子科技大学微电子与固体电子学院,成都610054

出　　处：《电子科技大学学报》2004年第3期309-311,315,共4页Journal of University of Electronic Science and Technology of China

摘　　要：在pH值为5～10的范围内,铊(I)与4-吗啉二硫代羧酸钾生成不溶于水的螯合物并定量的吸附在微晶萘的表面上。用15 ml的1.5 mol/L的HCl使该不溶性螯合物脱附溶解后,在滴汞电极(DME)上用微分脉冲极谱(DPP)法测定痕量的铊(I)取得了很好的效果。该分析方法的检测限达到0.025 mg/ml,所测定的铊(I)浓度的线性范围达到0.05～10 mg/ml,标准曲线的相关系数g = 0. 999 5,相对标准偏差为 0.90。After Tl(I)- morpholine-4-carbodithioate complex is formed by the complex reaction of Tl(I) with morpholine-4-carbodithioate, the Tl(I) complex is quantitatively adsorbed onto microcrystalline naphthalene in the range of pH=5～10.The trace amount of thallium is determined by differential pulse polarography on DME after the adsorption of its morpholine-4-carbodithioate is decomposed in 15 ml of 1.5 mol/L HCl. The detection limit of thallium is 0.025 mg/ml and the linear range of concentration is 0.05～10 mg/ml with a correlation coefficient of 0.999 5 and a relative standard deviation of 0.90.

关 键 词：铊 微分脉冲极谱 滴汞电极 4-吗啉二硫代羧酸钾 

分 类 号：O657.14[理学—分析化学] O649.4[理学—化学]