高功率二极管激光器寿命测试  

Lifetime testing of high power diode laser

作　　者：高松信[1] 魏彬[1] 吕文强[1] 武德勇[1] 

机构地区：[1]中国工程物理研究院应用电子学研究所,四川绵阳621900

出　　处：《强激光与粒子束》2004年第6期689-692,共4页High Power Laser and Particle Beams

基　　金：中国工程物理研究院重大预研项目资助课题

摘　　要：介绍了高功率激光二极管不同模式的失效机理 ,分析了激光二极管不同的寿命测试方法 ;在冷却水温 2 0℃和实际工作温度下分别对封装的激光器进行了寿命测试。根据试验结果得出退化率 ,推算出准连续二极管激光器在水温 2 0℃ ,电流 90A ,占空比为 10 % (5 0 0Hz,2 0 0 μs)时 ,平均激光工作寿命为 2 .19× 10 9次脉冲 ;冷却水温 35℃时 ,其平均激光工作寿命下降为 1.6 5× 10 9次脉冲。由实验结果分析得出 ,高功率激光器封装工艺中的焊料沉积和多层焊接技术 。This paper introduces lifetime test methods and failure mechanisms of different modes for high power diode laser (DL). The diode laser lifetime is tested. According to the experimental result and degradation rate, the average lifetime of quasi-continuous wave (QCW) diode laser is 2.19 × 109 shots at room temperature, when the operating current is 90 A, 10% duty-cycle (500 Hz, 200 μs). But the average lifetime of DL reduces to 1.65 × 109 when the actual temperature is 35°C. Experimental results and analysis show that the environment temperature, deposit solder and multiple layers welding in the package technology are the key points to the reliability of diode laser.

关 键 词：激光二极管 可靠性 寿命 退化率 

分 类 号：TN248[电子电信—物理电子学]